LaboTex Workshops & Trainings:
Fundamental Knowledge of X-ray Based Texture Analysis
Texture Measurement Techniques

Organized by:

The trainings are intended for users of X-ray diffraction systems who want to deepen their knowledge of measurement and evaluation of pole figures and calculation of orientation distribution function:

Next term: in preparation;

For details please contact with Dr.Bonarski from IMMS PAS: nmbonars@imim-pan.krakow.pl
Dr. Jan Bonarski is the author of the pioneering works from texture tomography and monography entitled: "X-ray texture tomography of near-surface areas" (Progress in Materials Science Volume: 51, Issue: 1, January, 2006, pp. 61-149).

 

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